Advanced Characterization of FeNi-Based Films for the Development of Magnetic Field Sensors with Tailored Functional Parameters

Описание

Тип публикации: статья из журнала

Год издания: 2022

Идентификатор DOI: 10.3390/s22093324

Ключевые слова: anisotropy distribution, ferromagnetic resonance, high frequency applications, magnetic anisotropy, magnetic field sensors, magnetoimpedance, multilayered structures, thin films

Аннотация: Magnetometry and ferromagnetic resonance are used to quantitatively study magnetic anisotropy with an easy axis both in the film plane and perpendicular to it. In the study of single-layer and multilayer permalloy films, it is demonstrated that these methods make it possible not only to investigate the average field of perpendiculaПоказать полностьюr and in-plane anisotropy, but also to characterize their inhomogeneity. It is shown that the quantitative data from direct integral and local measurements of magnetic anisotropy are consistent with the direct and indirect estimates based on processing of the magnetization curves. The possibility of estimating the perpendicular magnetic anisotropy constant from the width of stripe domains in a film in the transcritical state is demonstrated. The average in-plane magnetic anisotropy field of permalloy films prepared by magnetron sputtering onto a Corning glass is almost unchanged with the thickness of a single-layer film. The inhomogeneity of the perpendicular anisotropy field for a 500 nm film is greater than that for a 100 nm film, and for a multilayer film with a total permalloy thickness of 500 nm, it is greater than that for a homogeneous film of the same thickness. © 2022 by the authors. Licensee MDPI, Basel, Switzerland.

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Издание

Журнал: Sensors

Выпуск журнала: Vol. 22, Is. 9

Номера страниц: 3324

ISSN журнала: 14248220

Издатель: MDPI

Персоны

  • Komogortsev S.V. (Kirensky Institute of Physics, Federal Research Center KSC SB RAS, Krasnoyarsk, 660036, Russian Federation, Institute of Physics, Siberian Federal University, Krasnoyarsk, 660041, Russian Federation)
  • Vazhenina I.G. (Kirensky Institute of Physics, Federal Research Center KSC SB RAS, Krasnoyarsk, 660036, Russian Federation, Institute of Physics, Siberian Federal University, Krasnoyarsk, 660041, Russian Federation)
  • Kleshnina S.A. (Kirensky Institute of Physics, Federal Research Center KSC SB RAS, Krasnoyarsk, 660036, Russian Federation, Institute of Physics, Siberian Federal University, Krasnoyarsk, 660041, Russian Federation)
  • Iskhakov R.S. (Kirensky Institute of Physics, Federal Research Center KSC SB RAS, Krasnoyarsk, 660036, Russian Federation)
  • Lepalovskij V.N. (Department of Magnetism of Solid State, Institute of Natural Sciences and Mathematics, Ural Federal University, Ekaterinburg, 620002, Russian Federation)
  • Pasynkova A.A. (Department of Magnetism of Solid State, Institute of Natural Sciences and Mathematics, Ural Federal University, Ekaterinburg, 620002, Russian Federation, Laboratory of Advanced Magnetic Materials, Institute of Metal Physics UD RAS, Ekaterinburg, 620108, Russian Federation)
  • Svalov A.V. (Department of Magnetism of Solid State, Institute of Natural Sciences and Mathematics, Ural Federal University, Ekaterinburg, 620002, Russian Federation)

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