Тип публикации: статья из журнала
Год издания: 2011
Идентификатор DOI: 10.1016/j.jmmm.2011.05.024
Ключевые слова: Co-P films, Chemically deposition, The polar Kerr and Faraday effects, Hysteresis loops, CoP films, Chemical deposition, Co films, Film magnetization, Film surface morphology, Incident light, Magnetic and magneto-optical properties, Magnetic layers, Polar Kerr effect, Polar-Kerr, Polycrystalline, Underlayers, Chemical analysis, Faraday effect, Kerr magnetooptical effect, Light reflection, Magnetic materials, Optical Kerr effect, Palladium, Cobalt
Аннотация: Features in the formation of chemically deposited polycrystalline Co-P films with thicknesses of a few nanometers are established by analyzing film surface morphology and variation in the film magnetization. It is shown that in the thickness range below 30 nm the polar Kerr effect value OK changes nonmonotonically and depends on a Показать полностьюwavelength of the incident light. For the films thicker than 30 nm, this value depends weakly on both the thickness and the wavelength. These features in the OK behavior are attributed to the Faraday effect, which is revealed at small thicknesses upon light reflection from the lower surface of a magnetic layer. It is found that the Faraday effect in the Co-P films exceeds that in the Co films by a factor of more than two. This effect is assumed to be caused by the presence of a Pd underlayer in the samples under study. (C) 2011 Elsevier BY. All rights reserved.
Журнал: JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS
Выпуск журнала: Vol. 323, Is. 20
Номера страниц: 2493-2496
ISSN журнала: 03048853
Место издания: AMSTERDAM
Издатель: ELSEVIER SCIENCE BV