Тип публикации: статья из журнала

Год издания: 2016

Идентификатор DOI: 10.1016/j.jmmm.2016.12.073

Ключевые слова: Ellipsometry, In situ measurements, Magneto-optical Kerr effect, Nanostructures, Optical properties, Thermal evaporation, Vacuum evaporation, Control nanostructures, Data interpretation, In-situ measurement, Magneto-optical Kerr effects, Synthesis and characterizations, Transverse magneto-optical kerr effects, Uniform magnetic fields, Vacuum thermal evaporation, Optical Kerr effect

Аннотация: In this work we report on new magneto-ellipsometry set-up that allows to grow thin films and nanostructures by ultrahigh vacuum thermal evaporation as well as to conduct in situ measurements during the growth in order to analyze and control nanostructures properties. Ellipsometry and transverse magneto-optical Kerr effect measuremeПоказать полностьюnts can be performed in situ inside this set-up. A uniform magnetic field of high intensity (more than 1. kOe) can be applied to samples inside the vacuum chamber. Also, we report on the developed method of data interpretation that is the base of the set-up software. Thus, we present a powerful tool for nanostructures synthesis and characterization. © 2016 Elsevier B.V.

Журнал: Journal of Magnetism and Magnetic Materials

Выпуск журнала: Vol. 440

Номера страниц: 153-156

• Maximova Olga A. (Kirensky Institute of Physics, Federal Research Center KSC SB RAS, Krasnoyarsk, Russian Federation)
• Kosyrev Nikolay N. (Kirensky Institute of Physics, Federal Research Center KSC SB RAS, Krasnoyarsk, Russian Federation; Siberian Federal University, Krasnoyarsk, Russian Federation)
• Yakovlev Ivan A. (Kirensky Institute of Physics, Federal Research Center KSC SB RAS, Krasnoyarsk, Russian Federation; Achinsk Branch of Krasnoyarsk State Agrarian University, Achinsk, Russian Federation)
• Shevtsov Dmitriy V. (Kirensky Institute of Physics, Federal Research Center KSC SB RAS, Krasnoyarsk, Russian Federation; Reshetnev Siberian State Aerospace University, Krasnoyarsk, Russian Federation)
• Lyaschenko Sergey A. (Kirensky Institute of Physics, Federal Research Center KSC SB RAS, Krasnoyarsk, Russian Federation; Reshetnev Siberian State Aerospace University, Krasnoyarsk, Russian Federation)
• Varnakov Sergey N. (Kirensky Institute of Physics, Federal Research Center KSC SB RAS, Krasnoyarsk, Russian Federation; Reshetnev Siberian State Aerospace University, Krasnoyarsk, Russian Federation)
• Ovchinnikov Sergey G. (Kirensky Institute of Physics, Federal Research Center KSC SB RAS, Krasnoyarsk, Russian Federation; Siberian Federal University, Krasnoyarsk, Russian Federation; Reshetnev Siberian State Aerospace University, Krasnoyarsk, Russian Federation)

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