Тип публикации: статья из журнала (материалы конференций, опубликованные в журналах)

Конференция: Moscow International Symposium on Magnetism, MISM 2014; Москва, Россия; Москва, Россия

Год издания: 2015

Идентификатор DOI: 10.4028/www.scientific.net/SSP.233-234.686

Ключевые слова: Amorphous films, Chemical deposition, Surface morphology, Atomic force microscopy, Deposition, Morphology, Nickel, Optical Kerr effect, Co-P alloy, Co-P films, Ni atoms, Polar Kerr effect, Rate of deposition, Saturation fields, Cobalt

Аннотация: Amorphous Co-P and Co-Ni-P films fabricated by chemical deposition under the same conditions are investigated. It is demonstrated that the phosphorous content in the Co-Ni-P exceeds than in the Co-P films by 1.5-2%. The atomic force microscopy analysis of the surface morphology shows that incorporation of Ni atoms in the Co-P alloyПоказать полностьюleads to coarsening of grains due to the higher rate of deposition of Ni atoms as compared with the rate of deposition of Co atoms. The reduction of the dispersion of the polar Kerr effect saturation field in the Co-Ni-P films is attributed to ordering of Co-Ni atomic pairs. © (2015) Trans Tech Publications, Switzerland.

Журнал: Solid State Phenomena

Выпуск журнала: Vol. 233-234

Номера страниц: 686-689

• Chzhan A.V. (Siberian Federal University)
• Seredkin V.A. (Kirensky Institute of Physics, Russian Academy of Sciences, Siberian Branch)
• Patrin G.S. (Siberian Federal University)
• Zabluda V.N. (Kirensky Institute of Physics, Russian Academy of Sciences, Siberian Branch)
• Rudenko R.Y. (Siberian Federal University)
• Zubavichus Y.V. (National Research Center ‘Kurchatov Institute')
• Mikhlin Y.L. (Institute of Chemistry and Chemical Technology, Russian Academy of Sciences, Siberian Branch)

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