Тип публикации: статья из журнала

Год издания: 2017

Идентификатор DOI: 10.17516/1997-1397-2017-10-2-223-232

Ключевые слова: Magneto-optical ellipsometry, Kerr effect, two-layer model, ferromagnetic metal, reflection, growth control

Аннотация: An approach to analysis of magneto-optical ellipsometry measurements is presented. A two-layer model of ferromagnetic reflective films is in focus. The obtained algorithm can be used to control optical and magneto-optical properties during films growth in

Журнал: JOURNAL OF SIBERIAN FEDERAL UNIVERSITY-MATHEMATICS & PHYSICS

Выпуск журнала: Vol. 10, Is. 2

Номера страниц: 223-232

ISSN журнала: 19971397

Место издания: KRASNOYARSK

Издатель: SIBERIAN FEDERAL UNIV

• Maximova Olga A. (Fed Res Ctr KSC SB RAS, Kirensky Inst Phys, Akademgorodok 50-38, Krasnoyarsk 660036, Russia; Siberian Fed Univ, Svobodny 79, Krasnoyarsk 660041, Russia)
• Ovchinnikov Sergey G. (Fed Res Ctr KSC SB RAS, Kirensky Inst Phys, Akademgorodok 50-38, Krasnoyarsk 660036, Russia; Siberian Fed Univ, Svobodny 79, Krasnoyarsk 660041, Russia)
• Kosyrev Nikolay N. (Fed Res Ctr KSC SB RAS, Kirensky Inst Phys, Akademgorodok 50-38, Krasnoyarsk 660036, Russia)
• Lyaschenko Sergey A. (Fed Res Ctr KSC SB RAS, Kirensky Inst Phys, Akademgorodok 50-38, Krasnoyarsk 660036, Russia; Reshetnev Siberian State Aerosp Univ, Krasnoyarsky Rabochy 31, Krasnoyarsk 660037, Russia)

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