Oblique light incidence method to study topological defects in nematic layers with conical boundary conditions

Описание

Тип публикации: статья из журнала

Год издания: 2021

Идентификатор DOI: 10.1038/s41598-021-96784-9

Аннотация: A polarization microscopy method to investigate the orientational structures and boojums formed in the chiral and achiral nematic layers under conical (tilted) boundary conditions has been developed. Oblique light incidence on nematic layer is used, due to which the phase difference between the ordinary and extraordinary waves depeПоказать полностьюnds on the director’s azimuthal angle. The phase difference gets maximal when the director azimuthal angle of achiral nematic φ(x, y) = 0 and an azimuthal angle at the center of the chiral nematic layer φ(x, y) = 0 independently of the total twist angle φTOTAL. It has been found that the m= + 1 boojums with the phase ξ= ± 90 ∘ and ξ= (- 90 ∘+ φTOTAL/ 2 ) are formed in achiral and chiral nematics, respectively, at the director tilt angle θd/2≅ 40 ∘ at the interface. In addition, the defectless structure of chiral nematic with the periodically variable azimuthal director angle on the substrates has been studied. © 2021, The Author(s).

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Издание

Журнал: Scientific Reports

Выпуск журнала: Vol. 11, Is. 1

Номера страниц: 17433

ISSN журнала: 20452322

Издатель: Nature Research

Персоны

  • Krakhalev Mikhail N. (Fed Res Ctr KSC SB RAS, Kirensky Inst Phys, Krasnoyarsk 660036, Russia; Siberian Fed Univ, Inst Engn Phys & Radio Elect, Krasnoyarsk 660041, Russia)