Тип публикации: статья из журнала
Год издания: 2003
Аннотация: X-ray diffraction analysis, nuclear magnetic resonance, and low-temperature magnetic measurements were used to study the structure and magnetic parameters of multilayered Co/Pd films. The ferromagnetic Co layers in the multilayered films were found to have a texture. Their X-ray diffraction patterns exhibit a principal (200) reflecПоказать полностьюtion of the fcc structure, whereas the X-ray diffraction patterns of Pd layers are characterized by the (111) reflection of the fcc structure. The saturation magnetization M(t(Co)) of a Co layer decreases by 25% as its thickness decreases to 6 Angstrom. This is related to the formation of a layer of a CoPd alloy 8 Angstrom thick at the interface. The exchange interaction parameter A also decreases with decreasing thickness of the Co layers. However, the behavior of the A(t(Co)) curve cannot be explained only by the formation of a CoPd alloy at the interface. The nuclear magnetic resonance spectra of the multilayered films may be resolved into two components; one of them is determined by Co atoms with the fcc nearest-neighbor surroundings, whereas the other is due to Co atoms with the hcp nearest-neighbor surroundings. The type of the NMR spectra and A(t(Co)) behavior were found to be due to the highly defect structure of ferromagnetic Co layers, which are formed as close-packed fcc structures with numerous stacking faults (layers of the hcp structure).
Журнал: PHYSICS OF METALS AND METALLOGRAPHY
Выпуск журнала: Vol. 95, Is. 3
Номера страниц: 242-247
ISSN журнала: 0031918X
Место издания: BIRMINGHAM