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Increase in Accuracy of the Solution of the Problem of Identification of Production Batches of Semiconductor Devices

Описание

Тип публикации: доклад, тезисы доклада, статья из сборника материалов конференций

Конференция: International Scientific-Technical Conference on Actual Problems of Electronic Instrument Engineering, APEIE 2018

Год издания: 2018

Идентификатор DOI: 10.1109/APEIE.2018.8546294

Ключевые слова: Electronics industry, Semiconductor devices, Space flight, Spacecraft equipment, Algorithm parameters, Comparative analysis, Electronic component, Homogeneity analysis, Level of integrations, Production batches, Radio products, Space electronics, Clusteri

Аннотация: Authors provide a comparative analysis of the results of applying various automatic grouping (clustering) algorithms to a problem of separating homogeneous batches of electrical radio products from a mixed batch. Authors consider opportunities of optimizi

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Издание

Журнал: 2018 14th International Scientific-Technical Conference on Actual Problems of Electronic Instrument Engineering, APEIE 2018 - Proceedings

Номера страниц: 363-367

Издатель: Institute of Electrical and Electronics Engineers Inc.

Персоны

  • Rozhnov I.P. (Reshetnev Siberian State University of Science and Technology, prosp. KrasnoyarskiyRabochiy 31, Krasnoyarsk, 660037, Russian Federation)
  • Orlov V.I. (Reshetnev Siberian State University of Science and Technology, prosp. KrasnoyarskiyRabochiy 31, Krasnoyarsk, 660037, Russian Federation)
  • Kazakovtsev L.A. (Reshetnev Siberian State University of Science and Technology, prosp. KrasnoyarskiyRabochiy 31, Krasnoyarsk, 660037, Russian Federation; Siberian Federal University, prosp. KrasnoyarskiyRabochiy 31, Krasnoyarsk, 660037, Russian Federation)

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