Original concept of cracked template with controlled peeling of the cells perimeter for high performance transparent EMI shielding films : научное издание

Описание

Тип публикации: статья из журнала

Год издания: 2023

Идентификатор DOI: 10.1016/j.surfin.2023.102793

Аннотация: The problem of sputtering of thick metal films on micro and nanotemplates is important for obtaining mesh transparent conductors with excellent optoelectric characteristics. In this work, we demonstrate for the first time the possibility of controlling the degree of peeling of the cell perimeter from the substrate for a cracked temПоказать полностьюplate based on egg white by alternating the operations of moistening the template with saturated water vapor and shock drying with hot air. Local peeling of the cracked template cells perimeter makes it possible to increase the thickness of the metal sputtered on the cracked template by more than 1 µm, which is not achievable for other lithographic approaches. Our technique was used to obtain thick Ag meshes with a low sheet resistance of no more than 1.59 Ω/sq and a transparency of about 89.1%. The thick Ag meshes show a shielding efficiency (SE) of 49 dB or 99.998% of the incident power of an electromagnetic wave at a frequency of 1 GHz. In a sandwich geometry, thick Ag meshes, which simulates a real shielding window, the shielding efficiency (SE) reaches 71 dB with a transparency of more than 80%.

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Издание

Журнал: Surfaces and Interfaces

Выпуск журнала: Т. 38

Номера страниц: 102793

ISSN журнала: 24680230

Издатель: Elsevier BV

Персоны

  • Voronin A.S. (Siberian Federal University, Krasnoyarsk, Russia 660041)
  • Fadeev Y.V. (Siberian Federal University, Krasnoyarsk, Russia 660041)
  • Ivanchenko F.S. (Federal Research Center «Krasnoyarsk Scientific Center, Siberian Branch, Russian Academy of Sciences» (FRC KSC SB RAS), Krasnoyarsk, Russia 660036)
  • Dobrosmyslov S.S. (Siberian Federal University, Krasnoyarsk, Russia 660041)
  • Makeev M.O. (Bauman Moscow State Technical University, Moscow Russia 105005)
  • Mikhalev P.A. (Bauman Moscow State Technical University, Moscow Russia 105005)
  • Osipkov A.S. (Bauman Moscow State Technical University, Moscow Russia 105005)
  • Damaratsky I.A. (Bauman Moscow State Technical University, Moscow Russia 105005)
  • Ryzhenko D.S. (Bauman Moscow State Technical University, Moscow Russia 105005)
  • Yurkov G.Y. (N.N. Semenov Federal Research Center of Chemical Physics of Russian Academy of Sciences, Moscow, Russia 119334)
  • Simunin M.M. (Reshetnev Siberian University Science and Technology, Krasnoyarsk, Russia 660037)
  • Volochaev M.N. (Kirensky Institute of Physics, Siberian Branch, Russian Academy of Sciences, Krasnoyarsk Russia 660036)
  • Tambasov I.A. (LLC Research and Production Company "Spectehnauka", Krasnoyarsk, Russia 660043)
  • Nedelin S.V. (LLC Research and Production Company "Spectehnauka", Krasnoyarsk, Russia 660043)
  • Zolotovsky N.A. (LLC Research and Production Company "Spectehnauka", Krasnoyarsk, Russia 660043)
  • Bainov D.D. (V.E. Zuev Institute of Atmospheric Optics, Siberian Branch, Russian Academy of Sciences, Tomsk, Russia 634055)
  • Khartov S.V. (Federal Research Center «Krasnoyarsk Scientific Center, Siberian Branch, Russian Academy of Sciences» (FRC KSC SB RAS), Krasnoyarsk, Russia 660036)

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