Тип публикации: статья из журнала

Год издания: 2021

Идентификатор DOI: 10.1134/S0021364021150066

Аннотация: It is known from experimental studies that the components of the permittivity tensor epsilon depend on layer thicknesses of multilayer thin films, and for nanometer layers, it is necessary to additionally consider the interlayer interfaces. This study provides an answer to the question of what is the reason for the influence of theПоказать полностьюse interfaces on film properties. It is shown that the contribution of interband matrix elements for ferromagnetic films with off-diagonal components of the permittivity tensor determines the ratio between the diagonal and off-diagonal components of the tensor epsilon at a ferromagnetic layer thickness of about 10 nm.

Журнал: JETP LETTERS

Выпуск журнала: Vol. 114, Is. 3

Номера страниц: 163-165

ISSN журнала: 00213640

Место издания: NEW YORK

Издатель: MAIK NAUKA/INTERPERIODICA/SPRINGER

• Ovchinnikov S.G. (Kirensky Inst Phys, Fed Res Ctr KSC, Siberian Branch, Russian Acad Sci, Krasnoyarsk 660036, Russia; Siberian Fed Univ, Krasnoyarsk 660041, Russia)
• Maximova O.A. (Kirensky Inst Phys, Fed Res Ctr KSC, Siberian Branch, Russian Acad Sci, Krasnoyarsk 660036, Russia; Siberian Fed Univ, Krasnoyarsk 660041, Russia)
• Lyaschenko S.A. (Kirensky Inst Phys, Fed Res Ctr KSC, Siberian Branch, Russian Acad Sci, Krasnoyarsk 660036, Russia)
• Yakovlev I.A. (Kirensky Inst Phys, Fed Res Ctr KSC, Siberian Branch, Russian Acad Sci, Krasnoyarsk 660036, Russia)
• Varnakov S.N. (Kirensky Inst Phys, Fed Res Ctr KSC, Siberian Branch, Russian Acad Sci, Krasnoyarsk 660036, Russia)

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