Тип публикации: доклад, тезисы доклада, статья из сборника материалов конференций

Конференция: INTERNATIONAL SIBERIAN CONFERENCE ON CONTROL AND COMMUNICATIONS; Astana, KAZAKHSTAN; Astana, KAZAKHSTAN

Год издания: 2017

Ключевые слова: Automated test equipment, intelligent devices, testing of complex multiparametric devices, ATE, HTE

Аннотация: This paper describes the structure and principles of automatic equipment for testing of complex multiparametric intelligent devices.

Журнал: 2017 INTERNATIONAL SIBERIAN CONFERENCE ON CONTROL AND COMMUNICATIONS (SIBCON) PROCEEDINGS

ISSN журнала: 23806508

Место издания: NEW YORK

Издатель: IEEE

• Gorchakovsky A. (Siberian Fed Univ, Inst Engn Phys & Radio Elect, Krasnoyarsk, Russia)
• Evstratko V. (Siberian Fed Univ, Inst Engn Phys & Radio Elect, Krasnoyarsk, Russia)
• Kamyshnikov A. (Siberian Fed Univ, Inst Engn Phys & Radio Elect, Krasnoyarsk, Russia)
• Kamyshnikova A. (Siberian Fed Univ, Inst Engn Phys & Radio Elect, Krasnoyarsk, Russia)
• Mishurov A. (Siberian Fed Univ, Inst Engn Phys & Radio Elect, Krasnoyarsk, Russia)
• Panko S. (Siberian Fed Univ, Mil Engn Inst, Krasnoyarsk, Russia)
• Sukhotin V. (Siberian Fed Univ, Mil Engn Inst, Krasnoyarsk, Russia)

• Web of Science Core Collection