Тип публикации: статья из журнала
Год издания: 2017
Идентификатор DOI: 10.1016/j.jmmm.2016.12.050
Ключевые слова: Ellipsometry, In situ measurements, Magneto-optical Kerr effect, Critical currents, Ferromagnetic materials, Dielectric tensors, Ferromagnetic films, Growth control, In-situ measurement, Magneto-optical ellipsometries, Magneto-optical Kerr effects, Real-time growth, Semi-infinite medium, Optical Kerr effect
Аннотация: In this work we present the way of ferromagnetic films study by means of magneto-ellipsometry. The method of interpretation of in situ magneto-optical ellipsometry spectra for real time growth control is described. The method has been successfully tested on . Si/SiO2/Fe films within the model of a homogeneous semi-infinite medium. Показать полностьюAs a result, the dielectric tensor components for Fe layer were calculated using a developed approach. © 2016 Elsevier B.V.
Журнал: JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS
Выпуск журнала: Vol. 440
Номера страниц: 196-198
Место издания: AMSTERDAM
Издатель: ELSEVIER SCIENCE BV