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Unit for Measuring the Magnetic Characteristics of Thin Ferromagnetic Films

Описание

Тип публикации: доклад, тезисы доклада, статья из сборника материалов конференций

Конференция: Ural Symposium on Biomedical Engineering, Radioelectronics and Information Technology, USBEREIT 2020

Год издания: 2020

Идентификатор DOI: 10.1109/USBEREIT48449.2020.9117609

Ключевые слова: ferromagnetic resonance, magnetic characteristics, measuring unit, thin magnetic films

Аннотация: Studying the properties of ferromagnetic films helps in solving the fundamental problems of the physics of magnetic phenomena and in developing the theory of ferromagnetism. Modern software and hardware, along with reliable diagnostic methods are used to research and design thin-film devices. In this regard, the development of deviПоказать полностьюces and methods for measuring the magnetic characteristics of thin ferromagnetic films is an essential task. The aim of the work is to develop an unit for local measurements of the magnetic characteristics of thin ferromagnetic films, which has the ability to change the degree of locality of measurements over a wide range and has high sensitivity at the same time. The article reviews a new unit for measuring the magnetic characteristics of thin ferromagnetic films. The unit allows measuring the value and direction of the anisotropy field on a local area of the film. A block diagram and description of a new unit, as well as methods of measurements are shown in the article. The experimentally obtained distribution of the anisotropy field over the area of the studied sample of Ni -{80} Fe-{20} film is shown in this work. The experimental results confirm the compliance of the new unit with the declared characteristics. The unit can be used for non-destructive quality control and for measuring uniformity of thin ferromagnetic films magnetic characteristics. © 2020 IEEE.

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Издание

Журнал: Proceedings - 2020 Ural Symposium on Biomedical Engineering, Radioelectronics and Information Technology, USBEREIT 2020

Номера страниц: 326-329

Персоны

  • Kleshnina S. (Kirensky Institute of Physics, Institute of Engineering Physics and Radioelectronics, Siberian Federal University, Laboratory of Electrodynamics and Microwave Electronics, Krasnoyarsk, Russian Federation)
  • Belyaev B. (Kirensky Institute of Physics, Institute of Engineering Physics and Radioelectronics, Siberian Federal University, Laboratory of Electrodynamics and Microwave Electronics, Krasnoyarsk, Russian Federation)
  • Boev N. (Kirensky Institute of Physics, Institute of Engineering Physics and Radioelectronics, Siberian Federal University, Laboratory of Electrodynamics and Microwave Electronics, Krasnoyarsk, Russian Federation)
  • Izotov A. (Kirensky Institute of Physics, Institute of Engineering Physics and Radioelectronics, Siberian Federal University, Laboratory of Electrodynamics and Microwave Electronics, Krasnoyarsk, Russian Federation)
  • Burmitskikh A. (Kirensky Institute of Physics, Institute of Engineering Physics and Radioelectronics, Siberian Federal University, Laboratory of Electrodynamics and Microwave Electronics, Krasnoyarsk, Russian Federation)
  • Gorchakovsky A. (Kirensky Institute of Physics, Laboratory of Electrodynamics and Microwave Electronics, Krasnoyarsk, Russian Federation)

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