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Application of the K-Standards Algorithm for the Clustering Problem of Production Batches of Semiconductor Devices : доклад, тезисы доклада

Описание

Тип публикации: доклад, тезисы доклада, статья из сборника материалов конференций

Конференция: 15th International Scientific-Technical Conference on Actual Problems of Electronic Instrument Engineering, APEIE 2021; Novosibirsk; Novosibirsk

Год издания: 2021

Идентификатор DOI: 10.1109/APEIE52976.2021.9647632

Ссылки на полный текст

Издание

Журнал: Proceedings of the 2021 15th International Scientific-Technical Conference on Actual Problems of Electronic Instrument Engineering, APEIE 2021

Номера страниц: 499-503

Издатель: Institute of Electrical and Electronics Engineers Inc.

Персоны

  • Orlov V.I. (Reshetnev Siberian State University of Science and Technology)
  • Rozhnov I.P. (Reshetnev Siberian State University of Science and Technology)
  • Kazakovtsev L.A. (Reshetnev Siberian State University of Science and Technology)
  • Rezova N.L. (Reshetnev Siberian State University of Science and Technology)
  • Popov V.P. (Reshetnev Siberian State University of Science and Technology)
  • Mikhnev D.L. (Jsc 'Testing Technical Center-NPO PM')

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