Тип публикации: статья из журнала (материалы конференций, опубликованные в журналах)

Год издания: 2011

Идентификатор DOI: 10.4028/www.scientific.net/SSP.168-169.273

Ключевые слова: Electron magnetic resonance, Interlayer coupling, Magnetization, Magnetoresistance, Semiconductor spacer, Trilayer films, Electric resistance, Magnetic field effects, Magnetoelectronics, Magnetic resonance, Magnetism, Exchange constants, SQUID magnetometry, Temperature dependent, Trilayer film, Trilayers, Cobalt

Аннотация: The interlayer coupling in Co/Ge/Co trilayer films has been experimentally studied by the SQUID magnetometry and electron magnetic resonance. It has been found that the interlayer coupling is temperature-dependent. The values of the exchange constants have been determined.

Журнал: Solid State Phenomena

Выпуск журнала: Vol. 168-169

Номера страниц: 273-276

• Kobyakov A.V. (Siberian Federal University)
• Patrin G.S. (Siberian Federal University)
• Turpanov I.A. (Kirensky Institute of Physics,Russian Academy of Sciences,Siberian Branch)
• Li L.A. (Kirensky Institute of Physics,Russian Academy of Sciences,Siberian Branch)
• Patrin K.G. (Siberian Federal University)
• Yushkov V.I. (Siberian Federal University)
• Petrakovskaya E.A. (Kirensky Institute of Physics,Russian Academy of Sciences,Siberian Branch)
• Rautskii M.V. (Kirensky Institute of Physics,Russian Academy of Sciences,Siberian Branch)

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