Investigation on microstructure transformation and failure behavior of Cu-Cd-Nb-CP electrical contact material

Описание

Тип публикации: статья из журнала (материалы конференций, опубликованные в журналах)

Год издания: 2005

Ключевые слова: Copper-based composite, Electrical contact material, Microstructure, Performance, Arc erosion, Micro-cracks, Copper compounds, Electric commutation, Failure (mechanical), Grain boundaries, Grain size and shape, Metallic matrix composites, Powder metallurgy, Scanning electron microscopy, Electric contacts

Аннотация: Dependence of microstructure upon transfer stability of the powder-metallurgy copper-diamond electrical contact material with Cr and Nb addition during type-test process is investigated by optical microscope and SEM observation. During making and breaking process, micro-cracks occurred along grain boundaries under electrical and meПоказать полностьюchanical forces. Addition of cadmium into the composite increases oxidizable capability of this material, and also leads to oxide accumulation along grain boundaries. These factors reduce the reliability of electrical contacts in practice. Arc erosion quantities during commutation operation processes relates with grain size of matrix and particle size of the second metallic phase. The optimal grain size is 20-50?m and 10-20 ?m for niobium particles in these tests. © 2005 Trans Tech Publications, Switzerland.

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Издание

Журнал: (2 November 2004 through 5 November 2004, Beijing

Выпуск журнала: Vol. 475-479

Номера страниц: 869-872

Персоны

  • Cui Y.S.
  • Shao W.Z.
  • Zhen L.
  • Ivanov V.V.
  • Cui Y.S. (Department of Materials Science,Harbin Institute of Technology)
  • Shao W.Z. (Department of Materials Science,Harbin Institute of Technology)
  • Zhen L. (Department of Materials Science,Harbin Institute of Technology)
  • Ivanov V.V. (Res. Inst. on Phys. and Engineering,Krasnoyarsk State University)

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