Тип публикации: доклад, тезисы доклада, статья из сборника материалов конференций

Конференция: International Scientific and Research Conference on Topical Issues in Aeronautics and Astronautics (TIAA); Krasnoyarsk, RUSSIA; Krasnoyarsk, RUSSIA

Год издания: 2016

Идентификатор DOI: 10.1088/1757-899X/155/1/012030

Ключевые слова: Data handling, Ellipsometry, Information analysis, Nanostructures, Ellipsometry measurements, Magneto-optical, Single-layer models, Optical Kerr effect

Аннотация: In this work we present the method of magneto-ellipsometry data analysis. Magneto-ellipsometry measurements are conducted in situ during nanostructures synthesis. Magnetic field is applied in configuration of magneto-optical transverse Kerr effect. Single-layer model of reflective nanostructures is in focus.

Журнал: XII INTERNATIONAL SCIENTIFIC AND RESEARCH CONFERENCE TOPICAL ISSUES IN AERONAUTICS AND ASTRONAUTICS

Выпуск журнала: Vol. 155

ISSN журнала: 17578981

Место издания: BRISTOL

Издатель: IOP PUBLISHING LTD

• Maximova O.A. (Reshetnev Siberian State Aerosp Univ, Krasnoyarsk 660037, Russia;; ; Siberian Fed Univ, Krasnoyarsk 660041, Russia;; )
• Kosyrev N.N. (RAS, Fed Res Ctr KSC SB, Kirensky Inst Phys, Krasnoyarsk 660036, Russia)
• Varnakov S.N. (Reshetnev Siberian State Aerosp Univ, Krasnoyarsk 660037, Russia;; ; RAS, Fed Res Ctr KSC SB, Kirensky Inst Phys, Krasnoyarsk 660036, Russia)
• Lyashchenko S.A. (Reshetnev Siberian State Aerosp Univ, Krasnoyarsk 660037, Russia;; ; RAS, Fed Res Ctr KSC SB, Kirensky Inst Phys, Krasnoyarsk 660036, Russia)
• Ovchinnikov S.G. (Reshetnev Siberian State Aerosp Univ, Krasnoyarsk 660037, Russia;; ; Siberian Fed Univ, Krasnoyarsk 660041, Russia;; ; RAS, Fed Res Ctr KSC SB, Kirensky Inst Phys, Krasnoyarsk 660036, Russia)

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