Тип публикации: доклад, тезисы доклада, статья из сборника материалов конференций
Конференция: International Workshop on Advanced Technologies in Material Science, Mechanical and Automation Engineering - MIP: Engineering-2019; Krasnoyarsk; Krasnoyarsk
Год издания: 2019
Аннотация: In this paper, we investigate the problem of separation of a mixed production batch of semiconductor devices for the space industry into homogeneous production batches. The method of factor analysis is applied to reduce the dimensionality of the problem. We investigate the impact of measured parameters of semiconductor devices in tПоказать полностьюhe accuracy of the separation of the mixed lot, composed several homogeneous batches. It was shown, that with any orthogonal rotations of factor structure as the number of homogeneous batches in the sample increases, the clustering accuracy reduces. Groups of semiconductor device parameters which have the greatest impact on the partition accuracy regardless of the number of homogeneous batches in the sample detected.
Журнал: IOP Conference Series: Materials Science and Engineering
Выпуск журнала: 537
Номера страниц: 032088
Издатель: Institute of Physics Publishing