Multilayered ferromagnetic nanostructures study: Processing data from magneto-ellipsometry measurements : научное издание


Тип публикации: статья из журнала

Год издания: 2018

Идентификатор DOI: 10.4028/

Ключевые слова: ellipsometry, ferromagnetic, Thin layered films, Transverse magneto-optical Kerr effect

Аннотация: Nowadays, the magneto-ellipsometry technique is considered as a promising tool for studying nanostructures. It leads to a great demand of both designing set-ups for conducting experiments and developing approaches to data processing. The later one is a problem in framework of in situ analysis as it would be useful to have an approaПоказать полностьюch to data analysis which is reliable, quick and reasonably easy. This work continues our previous study of layered nanostructures by means of magneto-ellipsometry technique and logically generalizes the approach to magneto-ellipsometry data analysis for the multi-layered model use. As a result, the algorithm with detailed description of necessary formulae is presented.

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Журнал: Diffusion and Defect Data. Pt A Defect and Diffusion Forum

Выпуск журнала: Т.386 DDF

Номера страниц: 131-136

ISSN журнала: 10120386

Издатель: Scitec Publications Ltd.


  • Maximova O.A. (Siberian Federal University)
  • Lyaschenko S.A. (Kirensky Institute of Physics of SB,RAS)
  • Varnakov S.N. (Kirensky Institute of Physics of SB,RAS)
  • Ovchinnikov S.G. (Kirensky Institute of Physics of SB,RAS)

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