Automatic equipment for testing of complex multiparametric intelligent devices : доклад, тезисы доклада

Описание

Тип публикации: доклад, тезисы доклада, статья из сборника материалов конференций

Конференция: International Siberian Conference on Control and Communications, SIBCON 2017; Astana; Astana

Год издания: 2017

Идентификатор DOI: 10.1109/SIBCON.2017.7998439

Ключевые слова: ATE, automated test equipment, HTE, intelligent devices, testing of complex multiparametric devices

Аннотация: This paper describes the structure and principles of automatic equipment for testing of complex multiparametric intelligent devices.

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Издание

Журнал: 2017 International Siberian Conference on Control and Communications, SIBCON 2017 - Proceedings

Номера страниц: 7998439

Издатель: Institute of Electrical and Electronics Engineers Inc.

Персоны

  • Gorchakovsky A. (Institute of Engineering Physic and Radio Electronics,Siberian Federal University)
  • Evstratko V. (Institute of Engineering Physic and Radio Electronics,Siberian Federal University)
  • Kamyshnikov A. (Institute of Engineering Physic and Radio Electronics,Siberian Federal University)
  • Kamyshnikova A. (Institute of Engineering Physic and Radio Electronics,Siberian Federal University)
  • Mishurov A. (Institute of Engineering Physic and Radio Electronics,Siberian Federal University)
  • Sukhotin V. (Institute of Engineering Physic and Radio Electronics,Siberian Federal University)
  • Panko S. (Military Engineering Institute,Siberian Federal University)

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