Nonparametric algorithm of electronic components test data pattern recognition

Описание

Тип публикации: доклад, тезисы доклада, статья из сборника материалов конференций

Конференция: International Workshop on Advanced Technologies in Material Science, Mechanical and Automation Engineering (MIP) - Engineering; Krasnoyarsk, RUSSIA; Krasnoyarsk, RUSSIA

Год издания: 2019

Идентификатор DOI: 10.1088/1757-899X/537/4/042021

Аннотация: The paper discusses the quality diagnostics of electrical radio components based on the results of non-destructive testing. A proposed clustering algorithm does not require preliminary information on the number of classes and the training sample. The algo

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Издание

Журнал: IOP Conference Series: Materials Science and Engineering

Выпуск журнала: Vol. 537, Is. 4

Номера страниц: 42021

ISSN журнала: 17578981

Издатель: Institute of Physics Publishing

Персоны

  • Koplyarova N.V. (Siberian Fed Univ, Svobodny Pr 79, Krasnoyarsk 660041, Russia)
  • Chzhan E.A. (Siberian Fed Univ, Svobodny Pr 79, Krasnoyarsk 660041, Russia)
  • Medvedev A.V. (Siberian Fed Univ, Svobodny Pr 79, Krasnoyarsk 660041, Russia)
  • Korneeva A.A. (Siberian Fed Univ, Svobodny Pr 79, Krasnoyarsk 660041, Russia)
  • Raskina A.V. (Siberian Fed Univ, Svobodny Pr 79, Krasnoyarsk 660041, Russia)
  • Kukartsev V.V. (Siberian Fed Univ, Svobodny Pr 79, Krasnoyarsk 660041, Russia; Siberian State Univ Sci & Technol, Krasnoyarskiy Rabochiy Ave 31, Krasnoyarsk 660037, Russia)
  • Tynchenko V.S. (Siberian Fed Univ, Svobodny Pr 79, Krasnoyarsk 660041, Russia; Siberian State Univ Sci & Technol, Krasnoyarskiy Rabochiy Ave 31, Krasnoyarsk 660037, Russia)