Тип публикации: статья из журнала
Год издания: 2001
Аннотация: A procedure of the structure factor simulation from a continuous electron density representation in combination with the full-profile structure refinement (Rietveld technique) was developed and applied to structural characterization of pure siliceous mesoporous mesophase materials C16-SiO2-MMM of the MCM-41 type. An analytical funcПоказать полностьюtion was exploited to simulate the continuous electron density. The function arguments were used as refinable structure parameters. The technique allows both the least-squares refinement of structural parameters using the fullprofile fitting and the E-map calculations providing additional information on the structure details. Determined pore sizes were in good agreement with those obtained by independent absorption-based method. The pore shape was found to be close to hexagonal geometry.
Журнал: Advances in X-Ray Analysis
Выпуск журнала: Т. 44
Номера страниц: 110-115
ISSN журнала: 10970002