Тип публикации: статья из журнала

Год издания: 2003

Идентификатор DOI: 10.1103/PhysRevB.68.045416

Аннотация: In situ stress measurements have been performed during the deposition of epitaxial Ag monolayers on a Fe whisker. A compressive stress of −0.6 GPa is measured above a 5-ML Ag thickness which is ascribed to the epitaxial misfit of −0.8% between Ag and Fe. Back-extrapolation of the coverage dependent stress measurements to zero coverПоказать полностьюage reveals an Ag-induced change of the surface stress of Fe(100) of −1.23 N/m. Comparing this surface stress change with the calculated surface stress for Ag(100) suggests a tensile surface stress of +2.05 N/m for clean Fe(100). The deposition of 2–5 layers of Ag does not change the stress induced by the first layer significantly. This almost stress free growth is assigned to a rougher surface morphology which is most likely caused by a surface alloy formation

Журнал: Physical Review B - Condensed Matter and Materials Physics

Номера страниц: 045416

ISSN журнала: 10980121

Издатель: American Physical Society

• Mahesh R. (Max-Planck-Institut für Mikrostrukturphysik, Weinberg 2, Halle, D-06120, Germany)
• Sander D. (Max-Planck-Institut für Mikrostrukturphysik, Weinberg 2, Halle, D-06120, Germany)
• Zharkov S.M. (Kirensky Institute of Physics,Siberian Division,Russian Academy of Sciences; Max-Planck-Institut für Mikrostrukturphysik, Weinberg 2, Halle, D-06120, Germany)
• Kirschner J. (Max-Planck-Institut für Mikrostrukturphysik, Weinberg 2, Halle, D-06120, Germany)

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