Hole-doping of mechanically exfoliated graphene by confined hydration layers

Описание

Тип публикации: статья из журнала

Год издания: 2015

Идентификатор DOI: 10.1007/s12274-015-0807-x

Ключевые слова: graphene, non-contact atomic force microscopy (NC-AFM, KPFM), liquid-solid interface structure, electronic transport in nanoscale materials and structures

Аннотация: By the use of non-contact atomic force microscopy (NC-AFM) and Kelvin probe force microscopy (KPFM), we measure the local surface potential of mechanically exfoliated graphene on the prototypical insulating hydrophilic substrate of CaF2(111). Hydration layers confined between the graphene and the CaF2 substrate, resulting from the Показать полностьюgraphene's preparation under ambient conditions on the hydrophilic substrate surface, are found to electronically modify the graphene as the material's electron density transfers from graphene to the hydration layer. Density functional theory (DFT) calculations predict that the first 2 to 3 water layers adjacent to the graphene hole-dope the graphene by several percent of a unit charge per unit cell.

Ссылки на полный текст

Издание

Журнал: NANO RESEARCH

Выпуск журнала: Vol. 8, Is. 9

Номера страниц: 3020-3026

ISSN журнала: 19980124

Место издания: BEIJING

Издатель: TSINGHUA UNIV PRESS

Персоны

  • Bollmann T.R.J. (Fachbereich Physik, Universitat Osnabruck)
  • Temmen M. (Fachbereich Physik, Universitat Osnabruck)
  • Reichling M. (Fachbereich Physik, Universitat Osnabruck)
  • Antipina L.Y. (Siberian Federal University)
  • Sorokin P.B. (National University of Science and Technology MISiS)