Тип публикации: доклад, тезисы доклада, статья из сборника материалов конференций
Конференция: International Scientific Conference Reshetnev Readings 2016
Год издания: 2017
Идентификатор DOI: 10.1088/1757-899X/255/1/012004
Аннотация: Supplying the electronic units of the complex technical systems with electronic devices of the proper quality is one of the most important problems for increasing the whole system reliability. Moreover, for reaching the highest reliability of an electronic unit, the electronic devices of the same type must have equal characteristicПоказать полностьюs which assure their coherent operation. The highest homogeneity of the characteristics is reached if the electronic devices are manufactured as a single production batch. Moreover, each production batch must contain homogeneous raw materials. In this paper, we propose an improved model for detecting the homogeneous production batches of shipped lot of electronic components based on implementing the kurtosis criterion for the results of non-destructive testing performed for each lot of electronic devices used in the space industry. © 2017 Published under licence by IOP Publishing Ltd.
Журнал: IOP Conference Series: Materials Science and Engineering
Выпуск журнала: Vol. 255, Is. 1
Номера страниц: 12004
ISSN журнала: 17578981
Издатель: Institute of Physics Publishing