Morphology and structure of the interface layers in Ni/Ge thin films


Тип публикации: статья из журнала (материалы конференций, опубликованные в журналах)

Конференция: Euro-Asian Symposium on Trends in MAGnetism: Nanomagnetism, EASTMAG 2013; Vladivostok, Russian Federation; Vladivostok, Russian Federation

Год издания: 2014

Идентификатор DOI: 10.4028/

Ключевые слова: Exchange interaction, Interface structure, Magnetic properties, Magneto - hard layer, Magneto - soft layer, Ni/Ge layer structures, Atomic force microscopy, Exchange interactions, Magnetos, Nanomagnetics, Thin films, Hard layers, Interface structures, Layer structures, Magnetic behavior, Magnetic orders, Morphology and structures, Mutual diffusion, Soft layers, Morphology

Аннотация: Morphology and structure of the interface in Ni/Ge thin films being due to the mutual diffusion of these elements are investigated with the help of atomic force microscope, high resolution electron microscope and micro-diffraction. Strong effect of interface in magnetic behavior of Ni layers is demonstrated and explained by formatiПоказать полностьюon of magnetic order in the interface and rough boundaries between layers. © (2014) Trans Tech Publications, Switzerland.

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Журнал: Solid State Phenomena

Выпуск журнала: Vol. 215

Номера страниц: 259-263