Estimation of the impact of semiconductor device parameters on the accuracy of separating a mixed production batch

Описание

Тип публикации: доклад, тезисы доклада, статья из сборника материалов конференций

Конференция: International Workshop on Advanced Technologies in Material Science, Mechanical and Automation Engineering (MIP) - Engineering; Krasnoyarsk, RUSSIA; Krasnoyarsk, RUSSIA

Год издания: 2019

Идентификатор DOI: 10.1088/1757-899X/537/3/032088

Аннотация: In this paper, we investigate the problem of separation of a mixed production batch of semiconductor devices for the space industry into homogeneous production batches. The method of factor analysis is applied to reduce the dimensionality of the problem.

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Издание

Журнал: IOP Conference Series: Materials Science and Engineering

Выпуск журнала: Vol. 537, Is. 3

Номера страниц: 32088

ISSN журнала: 17578981

Издатель: Institute of Physics Publishing

Авторы

  • Shkaberina G.Sh (Reshetnev Siberian State Univ Sci & Technol, 31 Krasnoyarskiy Rabochiy Av, Krasnoyarsk 660037, Russia)
  • Orlov V.I. (Reshetnev Siberian State Univ Sci & Technol, 31 Krasnoyarskiy Rabochiy Av, Krasnoyarsk 660037, Russia; Testing & Tech Ctr NPO PM, 20 Molodezhnaya St, Zheleznogorsk 662970, Russia)
  • Tovbis E.M. (Reshetnev Siberian State Univ Sci & Technol, 31 Krasnoyarskiy Rabochiy Av, Krasnoyarsk 660037, Russia)
  • Sugak E.V. (Reshetnev Siberian State Univ Sci & Technol, 31 Krasnoyarskiy Rabochiy Av, Krasnoyarsk 660037, Russia)
  • Kazakovtsev L.A. (Reshetnev Siberian State Univ Sci & Technol, 31 Krasnoyarskiy Rabochiy Av, Krasnoyarsk 660037, Russia; Siberian Fed Univ, 79 Svobodny Av, Krasnoyarsk 660041, Russia)