Estimation of the impact of semiconductor device parameters on the accuracy of separating a mixed production batch

Описание

Тип публикации: доклад, тезисы доклада, статья из сборника материалов конференций

Конференция: International Scientific Workshop «MIP Engineering 2019: Advanced Technologies in Material Science, Mechanical and Automation Engineering»; Krasnoyarsk; Krasnoyarsk

Год издания: 2019

Аннотация: In this paper, we investigate the problem of separation of a mixed production batch of semiconductor devices for the space industry into homogeneous production batches. The method of factor analysis is applied to reduce the dimensionality of the problem. We investigate the impact of measured parameters of semiconductor devices in tПоказать полностьюhe accuracy of the separation of the mixed lot, composed several homogeneous batches. It was shown, that with any orthogonal rotations of factor structure as the number of homogeneous batches in the sample increases, the clustering accuracy reduces. Groups of semiconductor device parameters which have the greatest impact on the partition accuracy regardless of the number of homogeneous batches in the sample detected.

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Издание

Журнал: IOP Conference Series: Materials Science and Engineering

Выпуск журнала: 537

Номера страниц: 32088

Издатель: Institute of Physics and IOP Publishing Limited

Авторы

  • Shkaberina G Sh (Reshetnev Siberian State University of Science and Technology)
  • Orlov V I (Testing and Technical Center - NPO PM)
  • Tovbis E M (Reshetnev Siberian State University of Science and Technology)
  • Sugak E V (Reshetnev Siberian State University of Science and Technology)
  • Kazakovtsev L A (3Siberian Federal University)

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