Improved classification em algorithm for the problem of separating semiconductor device production batches

Описание

Тип публикации: доклад, тезисы доклада, статья из сборника материалов конференций

Конференция: International Workshop on Advanced Technologies in Material Science, Mechanical and Automation Engineering (MIP) - Engineering; Krasnoyarsk, RUSSIA; Krasnoyarsk, RUSSIA

Год издания: 2019

Идентификатор DOI: 10.1088/1757-899X/537/5/052032

Аннотация: This paper focuses on new proposed algorithms for cluster problem solving. The proposed algorithms are based on Classification EM algorithm (CM-algorithm). The algorithms are new algorithms of the greedy heuristic method using the idea of searching in alt

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Издание

Журнал: IOP Conference Series: Materials Science and Engineering

Выпуск журнала: Vol. 537, Is. 5

Номера страниц: 52032

ISSN журнала: 17578981

Издатель: Institute of Physics Publishing

Авторы

  • Rozhnov I. (Reshetnev Siberian State Univ Sci & Technol, Prosp Krasnoyarskiy Rabochiy 31, Krasnoyarsk 660031, Russia)
  • Kazakovtsev L. (Reshetnev Siberian State Univ Sci & Technol, Prosp Krasnoyarskiy Rabochiy 31, Krasnoyarsk 660031, Russia; Siberian Fed Univ, 79 Svobodny Ave, Krasnoyarsk 660041, Russia)
  • Bezhitskaya E. (Reshetnev Siberian State Univ Sci & Technol, Prosp Krasnoyarskiy Rabochiy 31, Krasnoyarsk 660031, Russia)
  • Bezhitskiy S. (Reshetnev Siberian State Univ Sci & Technol, Prosp Krasnoyarskiy Rabochiy 31, Krasnoyarsk 660031, Russia; Siberian Fed Univ, 79 Svobodny Ave, Krasnoyarsk 660041, Russia)

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