Тип публикации: статья из журнала

Год издания: 2001

Аннотация: A procedure of the structure factor simulation from a continuous electron density representation in combination with the full-profile structure refinement (Rietveld technique) was developed and applied to structural characterization of pure siliceous mesoporous mesophase materials C16-SiO2-MMM of the MCM-41 type. An analytical funcПоказать полностьюtion was exploited to simulate the continuous electron density. The function arguments were used as refinable structure parameters. The technique allows both the least-squares refinement of structural parameters using the fullprofile fitting and the E-map calculations providing additional information on the structure details. Determined pore sizes were in good agreement with those obtained by independent absorption-based method. The pore shape was found to be close to hexagonal geometry.

Журнал: Advances in X-Ray Analysis

Выпуск журнала: Т. 44

Номера страниц: 110-115

ISSN журнала: 10970002

• Solovyov L.A. (Institute of Chemistry and Chemical Engineering, K.Marx str., 42, Krasnoyarsk 660049, Russia?)
• Kirik S.D. (Institute of Chemistry and Chemical Engineering, K.Marx str., 42, Krasnoyarsk 660049, Russia?)
• Shmakov A.N. (Boreskov Institute of Catalysis, Siberian Branch of the Russian Academy of Sciences)
• Romannikov V.N. (Boreskov Institute of Catalysis, Siberian Branch of the Russian Academy of Sciences)

• РИНЦ (eLIBRARY.RU)